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study of resistivity measurement
Typology: Summaries
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Objective: To measure and study the temperature dependent resistivity of VO 2 compound using home-made four probe setup. Materials/Apparatus required:
Four probe method - Four probe apparatus is one of the standard and most widely used apparatus for the measurement of resistivity of semiconductors. This method is employed when the sample is in the form of a thin wafer, such as a thin semiconductor material deposited on a substrate. The sample is millimeter in size and having a thickness w. It consists of four probe arranged linearly in a straight line at equal distance S from each other. A constant current is passed through the two probes and the potential drop V across the middle two probes is measured. An oven is provided with a heater to heat the sample so that behavior of the sample is studied with increase in temperature as shown in Fig. 1. Fig.1. Schematic of Four Probe set-up At a constant temperature, the resistance, R of a conductor is proportional to its length L and inversely proportional to its area of cross section A. 𝑅 = 𝜌 𝑙 𝐴
where ρ is the resistivity of the conductor and its unit is ohm-meter. A semiconductor has electrical conductivity intermediate in magnitude between that of a conductor and insulator. Semiconductor differs from metals in their characteristic property of decreasing electrical resistivity with increasing temperature. According to band theory, the energy levels of semiconductors can be grouped into two bands, valence band and the conduction band. In the presence of an external electric field it is electrons in the valence band that can move freely, thereby responsible for the electrical conductivity of
Fig.2 Schematic of Four Probe Experimental method used to measure the resistivity of VO 2 Fig.2 shows the Experimental arrangement that we have used to measure the resistivity of VO 2 .Here, four contacts are made on sample which is attached to sample holder(having heater(made up of Nichrome wire) and temperature sensor(PT100)).The middle two contacts are connected to Nano-voltmeter( Keithley ) to measure the voltage between those probes to avoid any contact resistance and the outside two contacts are connected to current source meter( Keithley ) to supply current to sample. The heater and temperature sensor are connected to temperature controller ( Lakeshore )to measure the temperature at constant intervals. This whole setup is controlled by Lab-View program. Description of instrument made for resistivity measurement in high temperature region(300-600K ) Fig.3 Schematic of Home-made four probe set-up for high-temperature resistivity measurement It is simple cylindrical shape instrument. The top portion has wire connections which are to be connected to Nano-voltmeter, current source meter and temperature controller. To achieve vacuum, the whole instrument is to be connected to vacuum pump assembly consisting of rotary and diffusion pump (described later).The sample holder assembly consists of heater(Nichrome wire)and temperature sensor(PT-100).Sample(made up of copper because it is a good conductor and has less linear coefficient of thermal expansion) is placed on mica sheet ,not directly on
sample holder so that the bottom surface acts as an insulator to avoid flow of heat from bottom surface.PT-100 is used as temperature sensor as its resistant varies linearly with temperature. Description of various other electrical instrument and components used-
be wired to the addition function so that the indicator displays the sum of the two controls.
Thickness(mm) 0. Width(mm) 0.
Graph-
T(K) As it is clear from above graph, there is sharp transition from metallic to semiconducting phase near 330K which may be accompanied by a structural change from tetragonal lattice in the M phase to monoclinic lattice in I phase as reported in research papers.(Ref.4 and Ref.5) Results and discussions